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author | Ilya Leoshkevich <iii@linux.ibm.com> | 2023-05-11 13:46:50 +0200 |
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committer | Thomas Huth <thuth@redhat.com> | 2023-05-16 09:14:18 +0200 |
commit | f8d7c90f836370d2a0c8fee8e6c43d49d35ad770 (patch) | |
tree | 5cba8cd5bc27e47f8c7c592088df2e247ac57fa1 /tests | |
parent | 970641de01908dd09b569965e78f13842e5854bc (diff) | |
download | qemu-f8d7c90f836370d2a0c8fee8e6c43d49d35ad770.zip qemu-f8d7c90f836370d2a0c8fee8e6c43d49d35ad770.tar.gz qemu-f8d7c90f836370d2a0c8fee8e6c43d49d35ad770.tar.bz2 |
tests/tcg/multiarch: Make the system memory test work on big-endian
Store the bytes in descending order on big-endian.
Invert the logic in the multi-byte signed tests on big-endian.
Make the checks in the multi-byte signed tests stricter.
Signed-off-by: Ilya Leoshkevich <iii@linux.ibm.com>
Reviewed-by: Alex Bennée <alex.bennee@linaro.org>
Message-Id: <20230511114651.439872-2-iii@linux.ibm.com>
Signed-off-by: Thomas Huth <thuth@redhat.com>
Diffstat (limited to 'tests')
-rw-r--r-- | tests/tcg/multiarch/system/memory.c | 67 |
1 files changed, 43 insertions, 24 deletions
diff --git a/tests/tcg/multiarch/system/memory.c b/tests/tcg/multiarch/system/memory.c index 214f7d4..e29786a 100644 --- a/tests/tcg/multiarch/system/memory.c +++ b/tests/tcg/multiarch/system/memory.c @@ -40,18 +40,21 @@ static void pdot(int count) } /* - * Helper macros for shift/extract so we can keep our endian handling - * in one place. + * Helper macros for endian handling. */ -#define BYTE_SHIFT(b, pos) ((uint64_t)b << (pos * 8)) -#define BYTE_EXTRACT(b, pos) ((b >> (pos * 8)) & 0xff) +#if __BYTE_ORDER__ == __ORDER_LITTLE_ENDIAN__ +#define BYTE_SHIFT(b, pos) (b << (pos * 8)) +#define BYTE_NEXT(b) ((b)++) +#elif __BYTE_ORDER__ == __ORDER_BIG_ENDIAN__ +#define BYTE_SHIFT(b, pos) (b << ((sizeof(b) - 1 - (pos)) * 8)) +#define BYTE_NEXT(b) (--(b)) +#else +#error Unsupported __BYTE_ORDER__ +#endif /* - * Fill the data with ascending value bytes. - * - * Currently we only support Little Endian machines so write in - * ascending address order. When we read higher address bytes should - * either be zero or higher than the lower bytes. + * Fill the data with ascending (for little-endian) or descending (for + * big-endian) value bytes. */ static void init_test_data_u8(int unused_offset) @@ -62,14 +65,14 @@ static void init_test_data_u8(int unused_offset) ml_printf("Filling test area with u8:"); for (i = 0; i < TEST_SIZE; i++) { - *ptr++ = count++; + *ptr++ = BYTE_NEXT(count); pdot(i); } ml_printf("done\n"); } /* - * Full the data with alternating positive and negative bytes. This + * Fill the data with alternating positive and negative bytes. This * should mean for reads larger than a byte all subsequent reads will * stay either negative or positive. We never write 0. */ @@ -119,7 +122,7 @@ static void init_test_data_u16(int offset) reset_start_data(offset); for (i = 0; i < max; i++) { - uint8_t low = count++, high = count++; + uint16_t low = BYTE_NEXT(count), high = BYTE_NEXT(count); word = BYTE_SHIFT(high, 1) | BYTE_SHIFT(low, 0); *ptr++ = word; pdot(i); @@ -139,9 +142,10 @@ static void init_test_data_u32(int offset) reset_start_data(offset); for (i = 0; i < max; i++) { - uint8_t b4 = count++, b3 = count++; - uint8_t b2 = count++, b1 = count++; - word = BYTE_SHIFT(b1, 3) | BYTE_SHIFT(b2, 2) | BYTE_SHIFT(b3, 1) | b4; + uint32_t b4 = BYTE_NEXT(count), b3 = BYTE_NEXT(count); + uint32_t b2 = BYTE_NEXT(count), b1 = BYTE_NEXT(count); + word = BYTE_SHIFT(b1, 3) | BYTE_SHIFT(b2, 2) | BYTE_SHIFT(b3, 1) | + BYTE_SHIFT(b4, 0); *ptr++ = word; pdot(i); } @@ -160,13 +164,13 @@ static void init_test_data_u64(int offset) reset_start_data(offset); for (i = 0; i < max; i++) { - uint8_t b8 = count++, b7 = count++; - uint8_t b6 = count++, b5 = count++; - uint8_t b4 = count++, b3 = count++; - uint8_t b2 = count++, b1 = count++; + uint64_t b8 = BYTE_NEXT(count), b7 = BYTE_NEXT(count); + uint64_t b6 = BYTE_NEXT(count), b5 = BYTE_NEXT(count); + uint64_t b4 = BYTE_NEXT(count), b3 = BYTE_NEXT(count); + uint64_t b2 = BYTE_NEXT(count), b1 = BYTE_NEXT(count); word = BYTE_SHIFT(b1, 7) | BYTE_SHIFT(b2, 6) | BYTE_SHIFT(b3, 5) | BYTE_SHIFT(b4, 4) | BYTE_SHIFT(b5, 3) | BYTE_SHIFT(b6, 2) | - BYTE_SHIFT(b7, 1) | b8; + BYTE_SHIFT(b7, 1) | BYTE_SHIFT(b8, 0); *ptr++ = word; pdot(i); } @@ -374,12 +378,20 @@ static bool read_test_data_s16(int offset, bool neg_first) ml_printf("Reading s16 from %#lx (offset %d, %s):", ptr, offset, neg_first ? "neg" : "pos"); + /* + * If the first byte is negative, then the last byte is positive. + * Therefore the logic below must be flipped for big-endian. + */ +#if __BYTE_ORDER__ == __ORDER_BIG_ENDIAN__ + neg_first = !neg_first; +#endif + for (i = 0; i < max; i++) { int32_t data = *ptr++; if (neg_first && data < 0) { pdot(i); - } else if (data > 0) { + } else if (!neg_first && data > 0) { pdot(i); } else { ml_printf("Error %d %c 0\n", data, neg_first ? '<' : '>'); @@ -399,12 +411,20 @@ static bool read_test_data_s32(int offset, bool neg_first) ml_printf("Reading s32 from %#lx (offset %d, %s):", ptr, offset, neg_first ? "neg" : "pos"); + /* + * If the first byte is negative, then the last byte is positive. + * Therefore the logic below must be flipped for big-endian. + */ +#if __BYTE_ORDER__ == __ORDER_BIG_ENDIAN__ + neg_first = !neg_first; +#endif + for (i = 0; i < max; i++) { int64_t data = *ptr++; if (neg_first && data < 0) { pdot(i); - } else if (data > 0) { + } else if (!neg_first && data > 0) { pdot(i); } else { ml_printf("Error %d %c 0\n", data, neg_first ? '<' : '>'); @@ -419,8 +439,7 @@ static bool read_test_data_s32(int offset, bool neg_first) * Read the test data and verify at various offsets * * For everything except bytes all our reads should be either positive - * or negative depending on what offset we are reading from. Currently - * we only handle LE systems. + * or negative depending on what offset we are reading from. */ read_sfn read_sfns[] = { read_test_data_s8, read_test_data_s16, |