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| author | Jonathan Cameron <Jonathan.Cameron@huawei.com> | 2023-05-30 14:36:03 +0100 |
|---|---|---|
| committer | Michael S. Tsirkin <mst@redhat.com> | 2023-06-23 02:54:40 -0400 |
| commit | bafe03083255da3a053144b77a5fbc7dbf9494f3 (patch) | |
| tree | e24eae2228858ecd96f1d788a5993ba6da280699 /qapi/cxl.json | |
| parent | b90a324eda7113b62b558aad43e2166eb52567d2 (diff) | |
| download | qemu-bafe03083255da3a053144b77a5fbc7dbf9494f3.zip qemu-bafe03083255da3a053144b77a5fbc7dbf9494f3.tar.gz qemu-bafe03083255da3a053144b77a5fbc7dbf9494f3.tar.bz2 | |
hw/cxl/events: Add injection of Memory Module Events
These events include a copy of the device health information at the
time of the event. Actually using the emulated device health would
require a lot of controls to manipulate that state. Given the aim
of this injection code is to just test the flows when events occur,
inject the contents of the device health state as well.
Future work may add more sophisticate device health emulation
including direct generation of these records when events occur
(such as a temperature threshold being crossed). That does not
reduce the usefulness of this more basic generation of the events.
Acked-by: Markus Armbruster <armbru@redhat.com>
Reviewed-by: Fan Ni <fan.ni@samsung.com>
Reviewed-by: Ira Weiny <ira.weiny@intel.com>
Signed-off-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Message-Id: <20230530133603.16934-8-Jonathan.Cameron@huawei.com>
Reviewed-by: Michael S. Tsirkin <mst@redhat.com>
Signed-off-by: Michael S. Tsirkin <mst@redhat.com>
Diffstat (limited to 'qapi/cxl.json')
| -rw-r--r-- | qapi/cxl.json | 53 |
1 files changed, 53 insertions, 0 deletions
diff --git a/qapi/cxl.json b/qapi/cxl.json index 2ad3103..d5b5293 100644 --- a/qapi/cxl.json +++ b/qapi/cxl.json @@ -141,6 +141,59 @@ }} ## +# @cxl-inject-memory-module-event: +# +# Inject an event record for a Memory Module Event (CXL r3.0 +# 8.2.9.2.1.3). This event includes a copy of the Device Health +# info at the time of the event. +# +# @path: CXL type 3 device canonical QOM path +# +# @log: Event Log to add the event to +# +# @flags: Event Record Flags. See CXL r3.0 Table 8-42 Common Event +# Record Format, Event Record Flags for subfield definitions. +# +# @type: Device Event Type. See CXL r3.0 Table 8-45 Memory Module +# Event Record for bit definitions for bit definiions. +# +# @health-status: Overall health summary bitmap. See CXL r3.0 Table +# 8-100 Get Health Info Output Payload, Health Status for bit +# definitions. +# +# @media-status: Overall media health summary. See CXL r3.0 Table +# 8-100 Get Health Info Output Payload, Media Status for bit +# definitions. +# +# @additional-status: See CXL r3.0 Table 8-100 Get Health Info Output +# Payload, Additional Status for subfield definitions. +# +# @life-used: Percentage (0-100) of factory expected life span. +# +# @temperature: Device temperature in degrees Celsius. +# +# @dirty-shutdown-count: Number of times the device has been unable +# to determine whether data loss may have occurred. +# +# @corrected-volatile-error-count: Total number of correctable errors +# in volatile memory. +# +# @corrected-persistent-error-count: Total number of correctable +# errors in persistent memory +# +# Since: 8.1 +## +{ 'command': 'cxl-inject-memory-module-event', + 'data': { 'path': 'str', 'log': 'CxlEventLog', 'flags' : 'uint8', + 'type': 'uint8', 'health-status': 'uint8', + 'media-status': 'uint8', 'additional-status': 'uint8', + 'life-used': 'uint8', 'temperature' : 'int16', + 'dirty-shutdown-count': 'uint32', + 'corrected-volatile-error-count': 'uint32', + 'corrected-persistent-error-count': 'uint32' + }} + +## # @cxl-inject-poison: # # Poison records indicate that a CXL memory device knows that a |