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authorSander de Smalen <sander.desmalen@arm.com>2021-07-26 20:17:22 +0100
committerSander de Smalen <sander.desmalen@arm.com>2021-07-26 20:27:48 +0100
commite745277012ec05d1e6f980e05f2a3ea7c827eeec (patch)
tree8a54eb5a70745c9915e8c11bd206c2a3804cdf21 /llvm/lib/CodeGen/AsmPrinter/CodeViewDebug.cpp
parente42edce4a349efeedde2ffd07a26a6335178d24b (diff)
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[AArch64] NFC: Make some AArch64-SVE LoopVectorize tests generic.
This change moves most of `sve-inductions.ll` to non-AArch64 specific LV tests using the `-target-supports-scalable-vectors` flag, because they're not explicitly AArch64-specific. One test builds on AArch64-specific knowledge regarding masked loads/stores, and remains in sve-inductions.ll.
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