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authorMark de Wever <koraq@xs4all.nl>2020-10-11 15:07:12 +0200
committerMark de Wever <koraq@xs4all.nl>2020-10-12 18:58:21 +0200
commit551caec4a8af79483823e2940d40afb4c1df5da1 (patch)
tree4e32e2a7dd3deb52516c2aed0d532a05e955f427 /llvm/lib/Bitcode/Reader/MetadataLoader.cpp
parent1ef0e94d5b0206f69e4e822c6828d0b5121c11fb (diff)
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Make likelihood lit test less brittle
Jeremy Morse discovered an issue with the lit test introduced in D88363. The test gives different results for Sony's `-O1`. The test needs to run at `-O1` otherwise the likelihood attribute will be ignored. Instead of running all `-O1` passes it only runs the lower-expect pass which is needed to lower `__builtin_expect`. Differential Revision: https://reviews.llvm.org/D89204
Diffstat (limited to 'llvm/lib/Bitcode/Reader/MetadataLoader.cpp')
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