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authorJames Newling <james.newling@gmail.com>2025-05-01 15:50:06 -0700
committerGitHub <noreply@github.com>2025-05-01 15:50:06 -0700
commited8d4fe0b1d8088bd1a4f99f77afe33f435ef668 (patch)
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[mlir][vector] Separate bitwidth specific tests out (#138071)
In https://github.com/llvm/llvm-project/pull/136581 the logic pertaining to bitwidth was removed from the patterns. This PR further factorizes bitwidth logic out of the main test file. The number of tests with bitwidth (in the new file added in this PR) is now lower than before this PR. This is because this PR only tests the bitwidth specific logic once (there was a fair amount of redundant testing before). I didn't do this test refactoring in https://github.com/llvm/llvm-project/pull/136581 because I wanted to make it clear that it was NFC by leaving the tests unchanged there
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