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authorYang Yujie <yangyujie@loongson.cn>2025-08-06 12:03:39 +0200
committerJakub Jelinek <jakub@gcc.gnu.org>2025-08-06 12:03:39 +0200
commit94d2bc6d08caad947a8897a538f2a9b64e16a11a (patch)
tree415710c9994d02a32c4ee1ce493fec1457909861 /gcc/testsuite
parent88f638e276c25e216b3d01c0d7aa25a0d17921d9 (diff)
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bitint: Zero-extend the result of a signed->unsigned widening cast
A widening cast from a signed _BitInt operand to an unsigned _BitInt type involves filling the extra limb(s) with sign extension. On a target that wants _BitInts extended in memory, if this unsigned type has a partial limb, the unused part of it should be zeroed. e.g. Assuming limb_mode == E_DImode, at the end of void test (unsigned _BitInt(519) *t, _BitInt(512) x) { *t = -x; } the most significant limb of *t should be masked with 0x7f. This patch also fixes gcc.dg/torture/bitint-16.c, which aborts at -O2 when the extension on load is optimized away. * gimple-lower-bitint.cc (bitint_large_huge::lower_mergeable_stmt): Zero-extend the partial limb of any unsigned _BitInt LHS assigned with a widening sign-extension. * gcc.dg/torture/bitint-83.c: New test.
Diffstat (limited to 'gcc/testsuite')
-rw-r--r--gcc/testsuite/gcc.dg/torture/bitint-83.c48
1 files changed, 48 insertions, 0 deletions
diff --git a/gcc/testsuite/gcc.dg/torture/bitint-83.c b/gcc/testsuite/gcc.dg/torture/bitint-83.c
new file mode 100644
index 0000000..8a9df44
--- /dev/null
+++ b/gcc/testsuite/gcc.dg/torture/bitint-83.c
@@ -0,0 +1,48 @@
+/* Derived from a test in gcc.dg/torture/bitint-16.c */
+/* { dg-do run { target bitint } } */
+/* { dg-options "-std=c23 -pedantic-errors" } */
+/* { dg-skip-if "" { ! run_expensive_tests } { "*" } { "-O0" "-O2" } } */
+/* { dg-skip-if "" { ! run_expensive_tests } { "-flto" } { "" } } */
+
+#include "../bitintext.h"
+
+#define BASIC_TESTS \
+ TEST(8) \
+ TEST(16) \
+ TEST(32)
+
+#if __BITINT_MAXWIDTH__ >= 519
+#define ALL_TESTS \
+ BASIC_TESTS \
+ TEST(64) \
+ TEST(128) \
+ TEST(256) \
+ TEST(512)
+#else
+#define ALL_TESTS BASIC_TESTS
+#endif
+
+#define TEST(N) \
+void \
+test##N (unsigned _BitInt(N + 7) *t, _BitInt(N) x) \
+{ \
+ *t = -x; \
+}
+ALL_TESTS
+#undef TEST
+
+volatile int y = 0;
+
+int
+main (void)
+{
+#define TEST(N) \
+ { \
+ unsigned _BitInt(N + 7) t; \
+ _BitInt(N) x = y + N; \
+ test##N (&t, x); \
+ BEXTC (t); \
+ }
+ ALL_TESTS
+#undef TEST
+}