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authorMaciej W. Rozycki <macro@imgtec.com>2015-11-20 16:14:33 +0000
committerMaciej W. Rozycki <macro@imgtec.com>2015-11-20 16:17:53 +0000
commit314cf376c5b5493eeea6d3b2a357a5c832943b30 (patch)
treedd5efc252f9c9b4f1510d4395d30ec50f6c7c6f7 /gdb/m32c-tdep.c
parentf21cd979851fb422b8c01ee26b85b0273885350e (diff)
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MIPS/GAS/testsuite: Tighten negative-match NaN tests
Fix a test quality regression introduced with commit 351cdf24 [[MIPS] Implement O32 FPXX, FP64 and FP64A ABI extensions] where MIPS ABI flags match patterns have been added to negative-match tests covering ELF file header flags. Negative-match tests succeed whenever there is a failure in matching output produced and consequently the likelihood of a false success increases when patterns to match irrelevant output are added. Therefore remove the irrelevant paterns so that the tests complete as soon as the line concerned has been seen. gas/testsuite/ * gas/mips/nan-legacy-1.d: Remove MIPS ABI flags match patterns. * gas/mips/nan-legacy-2.d: Likewise. * gas/mips/nan-legacy-3.d: Likewise. * gas/mips/nan-legacy-4.d: Likewise. * gas/mips/nan-legacy-5.d: Likewise.
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