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authorMaciej W. Rozycki <macro@imgtec.com>2017-05-19 15:08:16 +0100
committerMaciej W. Rozycki <macro@imgtec.com>2017-05-20 00:29:18 +0100
commitf0681695daa9d4fd493f3ca88f194675c9affbff (patch)
tree34ed427edc3160dfa01b98043baf66cbc1480c2b /bfd/elf64-mips.c
parent64517994807b0d6bb3c6fd106f117c03242fac72 (diff)
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binutils/testsuite: Permit the reuse of dump patterns
Complement commit 89210bdc8fd2 ("GAS: Permit the reuse of dump patterns"), <https://sourceware.org/ml/binutils/2010-07/msg00269.html>, and commit ef2b5578f693 ("MIPS: Enable NewABI tests for SDE targets"), <https://sourceware.org/ml/binutils/2012-08/msg00017.html>, and like the GAS and LD versions make the binutils version of `run_dump_test' also support the `dump' keyword, for reusing dump patterns between tests. binutils/ * testsuite/lib/utils-lib.exp (run_dump_test): Handle the `dump' option.
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