diff options
author | Simon Glass <sjg@chromium.org> | 2014-10-13 23:42:11 -0600 |
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committer | Simon Glass <sjg@chromium.org> | 2014-10-22 10:36:52 -0600 |
commit | 0ae0cb7b50ab7836fb2a625a389d7a83698c2150 (patch) | |
tree | 59a26153bfd003ecc93c53883fcf5627e29c84d7 | |
parent | ebcab48a031fc96d5d6292564a35cf772d4e539c (diff) | |
download | u-boot-0ae0cb7b50ab7836fb2a625a389d7a83698c2150.zip u-boot-0ae0cb7b50ab7836fb2a625a389d7a83698c2150.tar.gz u-boot-0ae0cb7b50ab7836fb2a625a389d7a83698c2150.tar.bz2 |
dm: sf: Add tests for SPI flash
Add a simple test for SPI that uses SPI flash. It operates by creating a
SPI flash file and using the 'sf test' command to test that all
operations work correctly.
Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Jagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
-rw-r--r-- | test/dm/Makefile | 1 | ||||
-rw-r--r-- | test/dm/sf.c | 43 | ||||
-rw-r--r-- | test/dm/test.dts | 17 |
3 files changed, 60 insertions, 1 deletions
diff --git a/test/dm/Makefile b/test/dm/Makefile index d1b9c9a..75d3d41 100644 --- a/test/dm/Makefile +++ b/test/dm/Makefile @@ -19,4 +19,5 @@ obj-$(CONFIG_DM_TEST) += ut.o ifneq ($(CONFIG_SANDBOX),) obj-$(CONFIG_DM_GPIO) += gpio.o obj-$(CONFIG_DM_SPI) += spi.o +obj-$(CONFIG_DM_SPI_FLASH) += sf.o endif diff --git a/test/dm/sf.c b/test/dm/sf.c new file mode 100644 index 0000000..57dd134 --- /dev/null +++ b/test/dm/sf.c @@ -0,0 +1,43 @@ +/* + * Copyright (C) 2013 Google, Inc + * + * SPDX-License-Identifier: GPL-2.0+ + */ + +#include <common.h> +#include <dm.h> +#include <fdtdec.h> +#include <spi.h> +#include <spi_flash.h> +#include <asm/state.h> +#include <dm/ut.h> +#include <dm/test.h> +#include <dm/util.h> + +/* Test that sandbox SPI flash works correctly */ +static int dm_test_spi_flash(struct dm_test_state *dms) +{ + /* + * Create an empty test file and run the SPI flash tests. This is a + * long way from being a unit test, but it does test SPI device and + * emulator binding, probing, the SPI flash emulator including + * device tree decoding, plus the file-based backing store of SPI. + * + * More targeted tests could be created to perform the above steps + * one at a time. This might not increase test coverage much, but + * it would make bugs easier to find. It's not clear whether the + * benefit is worth the extra complexity. + */ + ut_asserteq(0, run_command_list( + "sb save hostfs - spi.bin 0 200000;" + "sf probe;" + "sf test 0 10000", -1, 0)); + /* + * Since we are about to destroy all devices, we must tell sandbox + * to forget the emulation device + */ + sandbox_sf_unbind_emul(state_get_current(), 0, 0); + + return 0; +} +DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT); diff --git a/test/dm/test.dts b/test/dm/test.dts index 8489595..1fba792 100644 --- a/test/dm/test.dts +++ b/test/dm/test.dts @@ -81,7 +81,7 @@ compatible = "google,another-fdt-test"; }; - base-gpios { + gpio_a: base-gpios { compatible = "sandbox,gpio"; gpio-bank-name = "a"; num-gpios = <20>; @@ -92,4 +92,19 @@ gpio-bank-name = "b"; num-gpios = <10>; }; + + spi@0 { + #address-cells = <1>; + #size-cells = <0>; + reg = <0>; + compatible = "sandbox,spi"; + cs-gpios = <0>, <&gpio_a 0>; + spi.bin@0 { + reg = <0>; + compatible = "spansion,m25p16", "spi-flash"; + spi-max-frequency = <40000000>; + sandbox,filename = "spi.bin"; + }; + }; + }; |