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author | Craig Topper <craig.topper@intel.com> | 2020-04-17 13:37:47 -0700 |
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committer | Craig Topper <craig.topper@intel.com> | 2020-04-17 13:39:47 -0700 |
commit | 5f69e53e5592141bf81f41fdf92106bf5cc3821c (patch) | |
tree | 5d6dcfb62d316241ddbb5e4e55099b7489f87642 /clang | |
parent | 10b60dde767011c250649dc6a305379034c5b5c5 (diff) | |
download | llvm-5f69e53e5592141bf81f41fdf92106bf5cc3821c.zip llvm-5f69e53e5592141bf81f41fdf92106bf5cc3821c.tar.gz llvm-5f69e53e5592141bf81f41fdf92106bf5cc3821c.tar.bz2 |
[X86] Remove single incoming value phis from tests for the loop SAD pattern. NFC
InstCombine should ensure these don't exist.
I'm looking at making some changes to how we detect these
patterns and not having to worry about these phis will help.
Diffstat (limited to 'clang')
0 files changed, 0 insertions, 0 deletions