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authorDavid Sherwood <david.sherwood@arm.com>2025-06-04 08:56:21 +0100
committerGitHub <noreply@github.com>2025-06-04 08:56:21 +0100
commit11a9dad1a5d1e83338425f595c7685d1a0564121 (patch)
treeec9ccc3d3742b59534faeecd4e137e14f1e1d2f1 /clang/lib/CodeGen/CodeGenModule.cpp
parentc7c79d259025f0e5edf778a46e03aeb6affd7c73 (diff)
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[AArch64][NFC] Rewrite aarch64-reassociate-accumulators tests (#142625)
In this patch I've made two changes: 1. The aarch64-reassociate-accumulators-sve.ll test wasn't representative of loop vectorised code because the pointers were incrementing by a fixed value and so were only valid when vscale=1. I've changed this to increment the pointer by the appropriate scalable amount. 2. I've generated the CHECK lines for both the NEON and SVE test using filters to make the tests more maintainable.
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