Commit 2aff1fc3 authored by Chen-Yu Tsai's avatar Chen-Yu Tsai Committed by Mauro Carvalho Chehab
Browse files

media: ov5640: Disable transparent feature for test pattern 



The transparent feature for test patterns blends the test pattern with
an actual captured image. This makes the result non-static, subject to
changes in the sensor's field of view.

Test patterns should be predictable and deterministic, even if they are
dynamic patterns. Disable the transparent feature of the test pattern.

Signed-off-by: default avatarChen-Yu Tsai <wens@csie.org>
Signed-off-by: default avatarSakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: default avatarMauro Carvalho Chehab <mchehab+samsung@kernel.org>
parent a0c29afb

drivers/media/i2c/ov5640.c

+1 −2
Original line number Diff line number Diff line
@@ -2461,8 +2461,7 @@ static const char * const test_pattern_menu[] = { 


static const u8 test_pattern_val[] = {

	0,

	OV5640_TEST_ENABLE | OV5640_TEST_TRANSPARENT |

		OV5640_TEST_BAR_VERT_CHANGE_1 |

	OV5640_TEST_ENABLE | OV5640_TEST_BAR_VERT_CHANGE_1 |

		OV5640_TEST_BAR,

};