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| author | Jonathan Wright <jonathan.wright@arm.com> | 2021-08-06 15:37:34 +0100 |
|---|---|---|
| committer | Jonathan Wright <jonathan.wright@arm.com> | 2021-08-09 09:59:05 +0100 |
| commit | a5e3c1e2c8dafcd2f6e4eeb2b2fa38fd40c5eda3 (patch) | |
| tree | 19870512b305190dce6be4e5ff71c3b24df33aa9 /gcc/omp-low.c | |
| parent | da81e30d21fb4acd217d88779ca077f22aee92b2 (diff) | |
| download | gcc-a5e3c1e2c8dafcd2f6e4eeb2b2fa38fd40c5eda3.zip gcc-a5e3c1e2c8dafcd2f6e4eeb2b2fa38fd40c5eda3.tar.gz gcc-a5e3c1e2c8dafcd2f6e4eeb2b2fa38fd40c5eda3.tar.bz2 | |
testsuite: aarch64: Fix invalid SVE tests
Some scan-assembler tests for SVE code generation were erroneously
split over multiple lines - meaning they became invalid. This patch
gets the tests working again by putting each test on a single line.
The extract_[1234].c tests are corrected to expect that extracted
32-bit values are moved into 'w' registers rather than 'x' registers.
gcc/testsuite/ChangeLog:
2021-08-06 Jonathan Wright <jonathan.wright@arm.com>
* gcc.target/aarch64/sve/dup_lane_1.c: Don't split
scan-assembler tests over multiple lines. Expect 32-bit
result values in 'w' registers.
* gcc.target/aarch64/sve/extract_1.c: Likewise.
* gcc.target/aarch64/sve/extract_2.c: Likewise.
* gcc.target/aarch64/sve/extract_3.c: Likewise.
* gcc.target/aarch64/sve/extract_4.c: Likewise.
Diffstat (limited to 'gcc/omp-low.c')
0 files changed, 0 insertions, 0 deletions