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author | Juzhe-Zhong <juzhe.zhong@rivai.ai> | 2023-12-04 21:44:56 +0800 |
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committer | Pan Li <pan2.li@intel.com> | 2023-12-04 21:47:51 +0800 |
commit | 018ba3ac952bed4ae01344c060360f13f7cc084a (patch) | |
tree | 820c73a35875e65c53416ac916d016e21cd31000 /gcc/function.h | |
parent | 27fde325d64447a3a0d5d550c5976e5f3fb6dc16 (diff) | |
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RISC-V: Fix overlap group incorrect overlap on v0
In serious high register pressure case (appended in this patch):
We see vluxei8.v v0,(s1),v1,v0.t which is not allowed.
Since according to RVV ISA:
+;; The destination vector register group for a masked vector instruction cannot overlap the source mask register (v0),
+;; unless the destination vector register is being written with a mask value (e.g., compares) or the scalar result of a reduction.
Such case doesn't have spillings, however, we expect such case should be spilled and reload data.
The rootcause is I made a mistake in previous patch on matching dest operand and mask operand constraints:
dest: "=vr"
mask: "vmWc1"
After this patch:
dest: "vd,vr"
mask: "vm,Wc1"
make EEW widening pattern are same as other instruction patterns.
PR target/112431
gcc/ChangeLog:
* config/riscv/vector.md: Fix incorrect overlap in v0.
gcc/testsuite/ChangeLog:
* gcc.target/riscv/rvv/base/pr112431-34.c: New test.
Diffstat (limited to 'gcc/function.h')
0 files changed, 0 insertions, 0 deletions