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authorJuzhe-Zhong <juzhe.zhong@rivai.ai>2023-12-04 21:44:56 +0800
committerPan Li <pan2.li@intel.com>2023-12-04 21:47:51 +0800
commit018ba3ac952bed4ae01344c060360f13f7cc084a (patch)
tree820c73a35875e65c53416ac916d016e21cd31000 /gcc/function.h
parent27fde325d64447a3a0d5d550c5976e5f3fb6dc16 (diff)
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RISC-V: Fix overlap group incorrect overlap on v0
In serious high register pressure case (appended in this patch): We see vluxei8.v v0,(s1),v1,v0.t which is not allowed. Since according to RVV ISA: +;; The destination vector register group for a masked vector instruction cannot overlap the source mask register (v0), +;; unless the destination vector register is being written with a mask value (e.g., compares) or the scalar result of a reduction. Such case doesn't have spillings, however, we expect such case should be spilled and reload data. The rootcause is I made a mistake in previous patch on matching dest operand and mask operand constraints: dest: "=vr" mask: "vmWc1" After this patch: dest: "vd,vr" mask: "vm,Wc1" make EEW widening pattern are same as other instruction patterns. PR target/112431 gcc/ChangeLog: * config/riscv/vector.md: Fix incorrect overlap in v0. gcc/testsuite/ChangeLog: * gcc.target/riscv/rvv/base/pr112431-34.c: New test.
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