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authorKyrylo Tkachov <kyrylo.tkachov@arm.com>2018-03-27 16:52:10 +0000
committerKyrylo Tkachov <ktkachov@gcc.gnu.org>2018-03-27 16:52:10 +0000
commitf84b3c0bb84d976ef74829eb514671c8a88a8c40 (patch)
tree230059f436e65ec78f303190341f349df648be6e
parent974e8240c083ce4942a7310da42e2d9260af125c (diff)
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[AArch64] XFAIL gcc.target/aarch64/store_v2vec_lanes.c for ILP32
The test in question fails for ilp32. The initial analysis I did in the PR for it is that for ILP32 we generate somewhat different address forms that we'd need to adjust aarch64_classify_address to catch. Given the optimisation this test checks for was added for GCC 8 it is not a regression, and improving the codegen on ILP32 would be an enhancement rather than a fix. So Richi has asked for it to be marked as XFAIL on ILP32, which is what this patch does. Checked that the test still passes on LP64 and appears as XFAIL on -mabi=ilp32. PR target/83009 * gcc.target/aarch64/store_v2vec_lanes.c: XFAIL for ilp32. From-SVN: r258894
-rw-r--r--gcc/testsuite/ChangeLog5
-rw-r--r--gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c6
2 files changed, 8 insertions, 3 deletions
diff --git a/gcc/testsuite/ChangeLog b/gcc/testsuite/ChangeLog
index 1b566b8..269df7a 100644
--- a/gcc/testsuite/ChangeLog
+++ b/gcc/testsuite/ChangeLog
@@ -1,3 +1,8 @@
+2018-03-27 Kyrylo Tkachov <kyrylo.tkachov@arm.com>
+
+ PR target/83009
+ * gcc.target/aarch64/store_v2vec_lanes.c: XFAIL for ilp32.
+
2018-03-27 Ramana Radhakrishnan <ramana.radhakrishnan@arm.com>
PR target/81863
diff --git a/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c b/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c
index 6810db3..990aea3 100644
--- a/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c
+++ b/gcc/testsuite/gcc.target/aarch64/store_v2vec_lanes.c
@@ -26,6 +26,6 @@ construct_lane_2 (long long *y, v2di *z)
values from consecutive memory into a 2-element vector by using
a Q-reg LDR. */
-/* { dg-final { scan-assembler-times "stp\td\[0-9\]+, d\[0-9\]+" 1 } } */
-/* { dg-final { scan-assembler-times "stp\tx\[0-9\]+, x\[0-9\]+" 1 } } */
-/* { dg-final { scan-assembler-not "ins\t" } } */
+/* { dg-final { scan-assembler-times "stp\td\[0-9\]+, d\[0-9\]+" 1 { xfail ilp32 } } } */
+/* { dg-final { scan-assembler-times "stp\tx\[0-9\]+, x\[0-9\]+" 1 { xfail ilp32 } } } */
+/* { dg-final { scan-assembler-not "ins\t" { xfail ilp32 } } } */