Age | Commit message (Expand) | Author | Files | Lines |
---|---|---|---|---|
2019-12-17 | dm: i2c: EEPROM simulator add tests for addr offset mask | Robert Beckett | 1 | -0/+65 |
2019-12-17 | dm: i2c: EEPROM simulator allow tests visibility of addr and offset | Robert Beckett | 1 | -15/+35 |
2018-11-29 | dm: sandbox: i2c: Use new emulator parent uclass | Simon Glass | 1 | -1/+1 |
2018-05-07 | SPDX: Convert all of our single license tags to Linux Kernel style | Tom Rini | 1 | -2/+1 |
2016-07-27 | dm: Use dm_scan_fdt_dev() directly where possible | Simon Glass | 1 | -2/+2 |
2015-05-21 | test: Generalize the unit test framework | Joe Hershberger | 1 | -10/+10 |
2015-05-05 | dm: i2c: Add an explicit test mode to the sandbox I2C driver | Simon Glass | 1 | -0/+8 |
2015-02-12 | dm: i2c: Add a dm_ prefix to driver model bus speed functions | Simon Glass | 1 | -3/+3 |
2015-01-29 | dm: i2c: Provide an offset length parameter where needed | Simon Glass | 1 | -5/+5 |
2015-01-29 | dm: i2c: Rename driver model I2C functions to permit compatibility | Simon Glass | 1 | -30/+30 |
2014-12-11 | dm: i2c: Add tests for I2C | Simon Glass | 1 | -0/+216 |