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authorSimon Glass <sjg@chromium.org>2020-07-28 19:41:12 -0600
committerTom Rini <trini@konsulko.com>2020-08-07 22:31:32 -0400
commite180c2b129016baf21086eca73767844e7eff185 (patch)
tree9024230dcb1a4f3480cc18a4bed4e965ff406d51 /include/test
parentbd34715599c17e0d3f09af1cdfba8af120bc8602 (diff)
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dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass <sjg@chromium.org>
Diffstat (limited to 'include/test')
-rw-r--r--include/test/test.h10
1 files changed, 10 insertions, 0 deletions
diff --git a/include/test/test.h b/include/test/test.h
index 029288d..ff92c39 100644
--- a/include/test/test.h
+++ b/include/test/test.h
@@ -7,6 +7,7 @@
#define __TEST_TEST_H
#include <malloc.h>
+#include <linux/bitops.h>
/*
* struct unit_test_state - Entire state of test system
@@ -27,6 +28,15 @@ struct unit_test_state {
char actual_str[256];
};
+/* Test flags for each test */
+enum {
+ UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
+ UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
+ UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
+ UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
+ UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
+};
+
/**
* struct unit_test - Information about a unit test
*